EnglishThe W25N-JW series is a high-performance memory solution featuring Buffer and Continuous Read modes, along with built-in ECC and Bad Block Management Lookup Table (BBM LUT), which uses a look-up table to replace bad blocks with reserved good ones, ensuring a continuous and reliable memory map for users. It supports code shadowing to RAM, direct execution from Dual/Quad SPI, and reliable storage of text and data. With high density and robust performance, the W25N-JW series is well suited for networking and related applications.
Characteristics
- Voltage: 1.8V
- Density: 1Gb and 2Gb
- Interface: SPI, Dual, Quad
- Page size: 2048 + 64 byte
- Speed: STR 166MHz, DTR 80MHz
- Features:
- Bad Block Management Lookup Table (BBM LUT)
- Up to 105°C operating temperature
- Buffer and Continuous Read mode
- Automotive grade 2 and 2+
Target Applications
- Automotive
- HDD
- Smart doorbell
- Wearable
