2Gb NAND + 1Gb LPDDR2
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Features
W29N02GZ NAND Flash Memory
• Basic Features
– Density : 2Gbit (Single chip solution)
– Vcc : 1.7V to 1.95V
– Bus width : x8
– Operating temperature
Industrial: -40°C to 85°C
• Single-Level Cell (SLC) technology.
• Organization
– Density: 2G-bit/256M-byte
– Page size
2,112 bytes (2048 + 64 bytes)
– Block size
64 pages (128K + 4K bytes)
• Highest Performance
– Read performance (Max.)
Random read: 25us
Sequential read cycle: 25ns
– Write Erase performance
Page program time: 250us(typ.)
Block erase time: 2ms(typ.)
– Endurance 100,000 Erase/Program Cycles
– 10-years data retention
• Command set
– Standard NAND command set
– Additional command support
Copy Back
Two-plane operation
– Contact Winbond for OTP feature
– Contact Winbond for block Lock feature
• Lowest power consumption
– Read: 25mA(typ.3V),T.B.D(typ.1.8V)
– Program/Erase: 10mA(typ.1.8V)
– CMOS standby: 10uA(typ.)W97AH2KK Low Power DDR2 SDRAM
• VDD1 = 1.7~1.95V
• VDD2/VDDCA/VDDQ = 1.14V ~ 1.30V
• Data width: x32
• Clock rate: up to 533MHz
• Four-bit prefetch DDR architecture
• Eight internal banks for concurrent operation
• Programmable READ and WRITE latencies (RL/WL)
• Programmable burst lengths: 4, 8, or 16
• Per Bank Refresh
• Partial Array Self-Refresh(PASR)
• Deep Power Down Mode (DPD Mode)
• Programmable output buffer driver strength
• Data mask (DM) for write data
• Clock Stop capability during idle periods
• Double data rate for data output
• Differential clock inputs
• Bidirectional differential data strobe
• Interface: HSUL_12
• JEDEC LPDDR2-S4B compliance
• Operating Temperature Range
-40 ~ 85 °C
- Package
- 8x10.5x1.0